ICMTS2025

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. The location rotates between Japan, Europe, and the United States. The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society.

This year the 37th ICMTS 2025 has been held in San Antonio (USA) on 25-27th of March. At the Conference Francesco Driussi  presented the paper entitled “Comparative Study of Switching Dynamics in Ferroelectric-based Capacitors with Different Design Options”, a work funded by the European project FIXIT, GA: 101135398.