Books

Nanoscale MOS transistors: Semi-classical transport and applications
D.Esseni, P. Palestri, L. Selmi
Cambridge University Press 2011

 

Fondamenti di Circuiti Digitali Integrati CMOS
David Esseni 
SGEditoriali, Padova, 2011
ISBN-13:  9788889884188

 

 

Book chapters and editorial works

Semi-analytic Modeling for Hot Carriers in Electron Devices
A. Zaka, P. Palestri, Q. Rafhay, R. Clerc, D. Rideau, L. Selmi,
in Hot Carrier Degradation in Semiconductor Devices, Publisher: Springer, pp. 151-196, 2015, ISBN 978-3-319-08993-5.

 

 

 

Sensitivity of Silicon Nanowire Biochemical Sensors
P. Palestri, M. Mouis, A. Afzalian, L. Selmi, F. Pittino, D. Flandre, G. Ghibaudo
in Beyond-CMOS Nanodevices 1, Publisher: Wiley, pp. 43-63, 2014, ISBN 978-1-848216549

 

 

Technology Computer Aided Design
D. Esseni, C. Jungemann, J. Lorenz, P. Palestri, E. Sangiorgi, L. Selmi
in Guide to State-of-the-Art Electron Devices, Publisher: Wiley, pp. 97-106, 2013, ISBN 978-1-118-34726-3

 

 

 

Modeling of End of the Roadmap nMOSFET with Alternative Channel Material
Q. Rafhay, R. Clerc, G. Ghibaudo, P. Palestri, L. Selmi
in Nanoscale CMOS - Innovative Materials, Modeling and Characterization, Publisher: Wiley, Hoboken, NJ, pp. 287-334, 2010, ISBN 978-1848211803

 

Modeling and Simulation Approaches for Gate Current Computation
B. Majkusiak, P. Palestri, A. Schenk, A. S. Spinelli, C. M. Compagnoni, M. Luisier
in Nanoscale CMOS - Innovative Materials, Modeling and Characterization, Publisher: Wiley, Hoboken, NJ, pp. 287-334, 2010, ISBN 978-1848211803

 

Quasiballistic Transport in Nano-MOSFETs
E. Sangiorgi, S. Eminente, C. Fiegna, P. Palestri, D. Esseni, L. Selmi
in Future Trends in Microelectronics: Up the Nano Creek, Publisher: Wiley-IEEE Press, pp. 287-295, 2007, ISBN 978-0-470-08146-4

 

Device Modeling
D. Esseni, P. Palestri, E. Sangiorgi
in Germanium-Based Technologies: From Materials to Devices, Publisher: Elsevier, 2007, ISBN-13: 978-0-08-044953-1

 

 

Advanced Physically Based Device Modeling for Gate Current and Hot Carrier Phenomena in Scaled MOSFETs
P. Palestri, L. Selmi, A. Dalla Serra, A. Abramo, E. Sangiorgi, M. Pavesi, P. Rigolli and F. Widdershoven
pp. 99-112, in Future Trends in Microelectronics: The Nano Millennium, Publisher: Wiley-IEEE Press, 2002, ISBN 0-471-21247-4