ICMTS 2026

IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS) 2026

 

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. The location rotates between Japan, Europe, and the United States. The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society.

 

This year the 38th ICMTS 2026 has been held in Matsue (JAP) on 23-26th of March. At the Conference, Francesco Driussi presented the paper entitled “Read Current in Ferroelectric Tunnel Junctions: Transient versus DC Contributions and Trap Related Effects”, a work funded by the European project FIXIT, GA: 101135398. Furthermore, Francesco Driussi have also presented the next year ICMTS Conference, that will be held in Udine in April 2027 and for which he will serve as General Chair.