ICMTS 2024

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. The location rotates between Japan, Europe, and the United States. The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society.

Francesco Driussi served this year as Technical Programme Chairman of ICMTS 2024, held in Edinburgh on 16-18th of April, coordinating the reviewing of the abstracts submitted for acceptance. He also organized the Conference Sessions. Furthermore, he presented the paper entitled “Analysis and Compensation of the Series Resistance Effects on the Characteristics of Ferroelectric Capacitors”, a work funded by the European projects FIXIT, GA: 101135398 and BeFerroSynaptic, GA: 871737.

Simone Saro, new research collaborator at NEDeC, presented instead the paper entitled “Compact expression to model the effects of dielectric absorption on analog-to-digital converters”, a work made in collaboration with Infineon Austria. Both the papers have been presented in the oral session “Ferroelectrics and Dielectrics”