ICMTS 2023

The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. 
The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society.

The paper titled "Bridging Large–Signal and Small–Signal Responses of Hafnium–Based Ferroelectric Tunnel Junctions" presented by Marco Massarotto  and in collaboration with NaMLab gGmbH thanks to the BeFerrosynaptic European framework, has been accepted for presentation at the 35th ICMTS edition which will be held in Tokyo, Japan, on March 27-30th 2023.
In this work, the elusive large- and small-signal behaviors of Ferroelectric Tunnel Junction synaptic devices have been investigated through novel experimental methodologies and simulations entirely developed and designed in our laboratory.